XRD in Industry

Dr. Milen Gateshki, Philips - Panalytical
 Thursday, October 11, 2018
 4pm in Dow 107 (Reception at 3:30pm in Dow 208)
 Presented jointly with the Department of Physics
 X-ray diffraction (XRD) is a powerful analytical technique that is widely used in research for structural investigation of new materials, but also in industrial applications ranging from characterization of raw materials in mining and cement production to quality control in pharmaceutical and semiconductor manufacturing. The continuous efforts to create new materials and devices with improved properties have also created the need to develop new analytical techniques for the characterization these materials. This has resulted in the rapid development and steady improvement of laboratory X-ray diffractometers, which employ state-of-the-art X-ray sources, optics, detectors and analytical software to meet the demands for increased performance. New methods and measurement techniques are introduced to facilitate the work of researchers and to provide insight into the properties of new materials.

In this presentation a brief introduction to XRD will be followed by several examples of new applications that have only recently become available on multipurpose laboratory X-ray diffractometers, such as Small Angle X-ray Scattering (SAXS, USAXS, GISAXS), Computed Tomography (CT), Pair Distribution Function (PDF) analysis and others.